Description

The 2606B High Density System SourceMeter (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. The 2606B improves density by 3 times and minimizes the need to add additional racks of test equipment. This SMU is the perfect solution for production testing of Laser Diodes, LEDs, 2- and 3-terminal semiconductors and much more.

• Four-channel stackable SMU instrument in a single 1U full rack chassis.
• Incorporates the capabilities of two of the industry leading 2602B SMUs.
• Tightly-integrated voltage/current source and measure instruments offer best in class performance with 61⁄2-digit resolution.
• TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput.
• TSP-Link expansion technology for multi-channel parallel test without a mainframe.
• TSP technology executes complete test programs from the 2600B’s non-volatile memory.

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