Tektronix Automated Characterization Suite (ACS) Software, ACS Basic, ACS Wafer Level Reliability Option

Automated Characterization Suite (ACS) software automates semiconductor device characterization at the device, wafer, or cassette level. Combined with Keithley’s wide range of source-measure instrumentation or S500 Integrated Test Systems, ACS-based solutions fill the gap between interactive lab-based setups and high-speed production test systems.

• ACS is a flexible, interactive software test environment that supports many Keithley instruments and parametric test systems.
• ACS-2600-RTM option with Series 2600B System SourceMeter® instruments provides a wafer level reliability solution.
• ACS Basic Edition is optimized for component and discrete device testing.
• ACS’s hardware support ranges from bench-top instruments used in a QA lab to automated rack-based parametric testers.
• For component and discrete device testing, ACS Basic Edition maximizes research and development productivity.

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